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The test is intended to check the instantaneous trip (magnetic trip mechanism) characteristics of an MCB as per its rating and curve at a conveniently low voltage

MCB Instantaneous Trip Test Bench (IEC: 60898-1:2002 Clause 9.10.2)

Lab Test

The SCR Elektroniks MCB Instantaneous Trip Test Bench is designed for Testing of MCB to carry out “Test of Instantaneous Tripping and of correct opening of the Contacts” as per IEC: 60898-1:2002 Clause 9.10.2 at rated voltage. This test is carried out with power factor between 0.95 and 1 with the sequence operation being O-t-CO-t-CO-t-CO with timings as specified in 9.12.11.1.

This test equipment also covers testing as per Indian Standard IS 8828 as well as Indonesian Standard SNI 8528-1 (BSN)

Completely stand alone test bench after initial configuration of parameters

Output terminals for displaying current on an oscilloscope

Sequence : By sequencing unit to get O-t-CO-t-CO-t-CO automatic

Necessary lamps for quick indication on the front panel

Microcontroller based timer to program test sequences

Easy Serviceability due to smart internal wiring pattern

Current Measurement : Transient Recording Meter to hold the current

Fixture: Electro-pneumatic Fixture with Protected compartment

Hold function on transient recording meter ensures holding the transient current value

Input : 415V, 2 phase with neutral

Time Measured : 0.1msec to 200msec

Rating of MCBs : 0.5A to 63A

Curve : B, C & D Short time

Test Current : 1.5A to 1500A

Load : Distributed Resistive Load Bank 0.01Ω to 100Ω

CT Ranges : 2.5A, 5A, 10A, 25A, 50A, 100A, 250A, 500A, 750A, 1500A (Selected through shorting link)

Selection of Load: By shorting link as per chart

Supply Required : a) Phase I Short Time 240V@700A b) Phase II 240V@ 5A

The product can be customized as per the MCB range (upto 63 A or 125 A) and as per the MCB curve. The PC based variant is not very popular, but the users can opt for the same if the voltage and current waveforms are desired to be plotted on a PC.

The product is intended to test the instantaneous trip capacity at rated voltage. This test follows a peculiar contact open and contact close pattern and is different in application than the magnetic test that is done at a conveniently low voltage.

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