MCCB AUDIT TEST BENCH WITH TEMPERATURE CHANBER

This is a hybrid 3 station-bench to test MCCB thermal tripping characteristics as per IEC 60947-2 cl 6.3.3

This is a hybrid 3 station-bench to test MCCB thermal tripping characteristics as per IEC 60947-2 cl 6.3.3

  • 440 V, 3 phase, 50 Hz input
  • In built thermal heating chamber of dimensions depending upon the MCCB rating
  • Output current programmable up to 800 A continuous (customizable)
  • Can test MCCBs of different ratings up to 250 A
  • Test Procedure options: IEC 60947-2 / customized
  • Pressure Required for pneumatic handling: Approximately 8-12 Bar depending on the MCCB size
  • PC provided: IBM PC / compatible make with NI LabVIEW based TestwareTM
  • 500 VA branded UPS

This is a hybrid 3 station-bench to test MCCB thermal tripping characteristics as per IEC 60947-2 cl 6.3.3 and custom based requirements at a controlled temperature (that can be set) adding another compliance parameter to the list. The speciality of this test system is its in built heater allowing the user to conduct the test at any desired temperature.

The system comes with user interface software configured in NI LabVIEW making testing of MCCBs complete where thermal curves with current as well as temperature rise can be plotted on a PC. The test terminals are such that different types of MCCBs can be mounted on the stand. The user can opt for a microcontroller based bench as well as a PC based test system.

In addition, the test bench incorporates micro controller based timer where in the user can program a desired time current sequence for a test cycle and also the number of test cycles for thermal trip test. In this test, 2 times can be saved, say each of one hour to cater to typical testing parameters such as Table 6, IEC 60947-2.

The product is optimized to include thermal overload current testing in a temperature chamber at a lesser cost thus making it ideally suitable for manufacturers / test lab engineers willing to compare tripping characteristics of MCBs at a desired temperature at different overload currents.

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